Abstract

Exchange-coupled double layers (ECDLs) and corresponding single layers of amorphous RE/TM alloys were sputtered. Their temperature-dependent magnetic behaviour was investigated by Kerr and VSM measurements. The obtained switching fields HS of the sublayers are shifted with respect to the coercivities HC by the coupling energy σw. In the extreme, this leads to a magnetization reversal against an applied field. The coupling energy was determined at a special temperature TS from the data for the ECDL only, and over the whole temperature range by combining the corrected HC values of the single layers with the switching fields HS of the ECDLs.

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