Abstract
The results of investigation of silicon solar cell defects design through a method of scanning electron microscopy is described. The model of influencing of antyreflective coating process parameters on informative parameters of silicon solar cell quality and reliability is reviewed. The obtained results can be utilised at development or refinement of silicon solar cell production technology for increase of their quality and reliability.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.