Abstract

The decay process of photogenerated charge carriers of ZnS:Mn,Cu luminescence materials after excitation with a short-pulse laser has been investingated in this paper by using the microwave absorption dielectric spectrum detection technique. It was found that the concentration of the Cu and Mn dopants has a great influence on the lifetime of electrons in the conduction band. The lifetime of electrons in the conduction band decreases obviously with increasing concentration of the Cu and Mn dopants. The effect of the concentration of Cu and Mn dopants on the luminescence intensity was also investigated.

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