Abstract

Sandwich structures of magnesium phthalocyanine (MgPc) thin films using aluminium (Al) and gold (Au) electrodes were prepared by thermal evaporation. Device characteristics of Al/MgPc/Au were found to show rectification properties. The electrical conductivity had been measured for the oxygen-doped, as-deposited and annealed samples. Current density–voltage characteristics under forward bias (aluminium electrode negative) were found to be due to the ohmic conduction at lower voltage regions with a hole concentration p0 = 3.92 × 1018 m−3 and mobility μp = 1.81 × 10−6 m2 V−1 s−1 for the as-deposited films. At higher voltage regions space charge limited conductivity (SCLC) controlled by a discrete trapping level of 4.51 × 1021 m−3 was obtained at about 0.73 eV above the valance band edge. The electrical parameters of oxygen-doped, as-deposited and annealed samples in the ohmic and SCLC regions were determined. The reverse bias curves were interpreted in terms of a transition from the electrode-limited Schottky emission to the bulk-limited Poole–Frenkel effect. The Schottky barrier parameters of oxygen-doped and annealed structures along with the as-deposited samples were determined from the C2–V characteristics. The space charge density N = 2.54 × 1022 m−3, built-in potential Vbi = 0.80 eV, depletion width W = 135 nm and barrier height φ = 1.09 eV were obtained for the as-deposited films.

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