Abstract
New applications of the electron back scattering diffraction (EBSD) technique for studying dislocation microstructures are presented. Examples from copper and steel samples are given to illustrate the links between crystallographic measurements and dislocation microstructure. The purpose of combining transmission electron microscopy (TEM) and EBSD is to obtain quantitative information about the evolution and heterogeneity of the dislocation microstructure, and how it depends on the texture of the material.
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