Abstract

Gating structure of one dimensional Cr layer is experimentally obtained through the technology of laser focused atomic deposition. The periodicity of grating is (212.8±0.2) nm measured by atomic force microscope, which is just equal to half of the wavelength of laser standing-wave field. Then, based on the semiclassical model and numerical calculation of the Adams-Bashforth-Moulton algorithm, both Cr atom motion trajectories are simulated and the atom-optical properties are analyzed at the same experimental conditions. The results show that the analytical results agree well with the experimental results.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call