Investigating the impact of X-ray irradiation on the SF6 gas discharge in GIS equipment

Abstract

ABSTRACT Gas Insulated Switchgear (GIS) is extensively utilized in power grid systems. However, the existence of numerous photoelectrons in the SF6 gas during X-ray non-destructive testing in ultra-high-voltage (UHV) GIS equipment may induce gas streamer discharge in a strong electric field. To address this issue, in this work, the impact of X-ray irradiation on the SF6 gas discharge in GIS equipment was systematically analyzed. Firstly, one GIS engineering mode with a three-dimensional electric field was established, and a physical GIS model was established by the Geant4 and Garfield++ codes. Secondly, the electrons’ ionization, and multiplication processes in SF6 gas during the X-ray irradiation were studied. Finally, a test platform with an equivalent electric field tube, which had the same intensity as in the GIS equipment, was established to verify the physical GIS model. X-ray beams with 0.1 MeV, 0.16 MeV, 0.3 MeV, and 1.25 MeV energy were used during the test process. From our analysis, it was concluded that X-ray irradiation can cause an electron avalanche in SF6 gas and the intensity of the avalanche is low, which is far away from the appearance of the streamer discharge.