Abstract
In this paper we present the scintillation properties of polished Lu3Al5O12: Pr (LuAG: Pr) crystals grown by the Czochralski method. The light yield (LY) and energy resolution were measured using XP5200B photomultiplier under excitation with α - and γ-rays. High LY of 20,800 and 5,700 ph/MeV were obtained at 662 keV γ-rays and 5.5 MeV α-rays, respectively, for a 2 mm thick sample. Light yield dependences on sample thickness were measured under excitation with α - and γ-rays and the intrinsic LY and light loss coefficient were evaluated. The LY ratio under excitation with α - and γ-rays (α/γ ratio) was also determined.
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