Abstract
In this paper we investigated the intrinsic impact of Bi(Zn1/2Ti1/2)O3 (BZT) addition on the crystallographic and ferroelectric properties of Pb(Zr0.4Ti0.6)O3 (PZT) thin films deposited by sol-gel technique. We could emphasis the shrinkage of lattice parameters, leading to a decrease of spontaneous polarization, with increasingly BZT content. This result is coherent with predicted evolution of spontaneous polarization with unit cell tetragonality.
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