Interpretation of TEM Images of Impurities in Electrodeposited Films

Abstract

Impurity inclusions in electrodeposited films can be imaged using a transmission electron microscope. Phase contrast by defocusing is used to detect small impurity molecules directly, whereas amplitude (diffraction) contrast is applied to image small strain fields associated with impurity inclusions. Principles of the phase/diffraction contrast for this application are described together with applications to several experimental results from microstructural studies on electrodeposited films.