Abstract
Piezoelectric thin-film-based cantilevers have been investigated for higher energy-harvesting performance with simplified processing steps. Here, a simple in situ film deposition process of heavily Nb-doped lead zirconate titanate (PZT) films, which does not require annealing and poling, has been demonstrated to verify the possibility of use of the resultant films as energy-harvesters specifically for low frequency vibrating sources. The in situ domain formation of the films during the deposition was demonstrated from the apparent shifts of the capacitance-electric field curves, indicating the presence of internal electric fields. The so-called imprint behavior was found to be directly related to the performance of piezoelectric energy harvesting. As an optimal example, 12 mol% Nb-doped cantilever harvesters that showed the largest imprint behavior exhibited the best values of ∼19.1 GPa figure-of-merit and ∼1436 μWcm−3g−2 power density, which are competitive compared to other reported values.
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