Interferences due to easily ionised elements in a microwave-induced plasma system with graphite-furnace sample introduction

Abstract

Several aspects of both enhancement and suppression of the analyte emission intensity caused by an easily ionised element (EIE) have been studied in an atmospheric pressure He microwave-induced plasma (MIP). A sequence of experiments, designed to elucidate possible mechanisms of this EIE effect, examines the following aspects: the concentration dependence of the effect for various EIEs; spatially separated vaporisation of EIE and analyte into the plasma; the effect of operating parameters upon the EIE-induced enhancement; the influence of the EIE on the excitation temperature and on the efficiency of coupling of microwave energy to the cavity. The EIE-induced suppression of emission intensity is consistent with reduced power dissipation in the plasma, due to decoupling of the plasma from the microwave power source, whereas the EIE-induced enhancement of emission intensity is best explained by a radiative energy transfer mechanism.