Interfacial interaction and glassy dynamics in stacked thin films of poly(methyl methacrylate).

Abstract

Neutron reflectivity and dielectric permittivity of alternately stacked thin films of protonated and deuterated poly(methyl methacrylate) were measured to elucidate a correlation between the time evolution of the interfacial structure and the segmental dynamics in the stacked thin polymer films during isothermal annealing above the glass transition temperature. The roughness at the interface between two thin layers increases with the annealing time, whereas the relaxation rate and strength of the α-process decrease with an increase in the annealing time. A strong correlation between the time evolution of the interfacial structure and the dynamics of the α-process during annealing could be observed using neutron reflectivity and dielectric relaxation measurements.