Abstract

This paper presents the results of an interfacial fracture study of Perovskite Light Emitting Devices (PLEDs). The interfacial robustness of the interfaces between the active layer and the adjacent layers of PLEDs is explored in an effort to simulate the effects of applied loads on pre-existing defects that are present in PLEDs. The dependence of interfacial fracture toughness on mode mixity (ratio of mode I and mode II) was studied using Brazil disk testing. The crack microstructure interactions associated with crack growth were then studied along with the underlying fracture modes and toughening mechanisms. The underlying toughening mechanisms were then modeled before discussing the implications of the current work for the design of mechanically robust PLEDs.

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