Year-end Sale % OFF 
Abstract
The interface between amorphous diamond films deposited by a filtered arc and germanium substrate was characterized by X-ray photoelectron spectroscopy. The coherent energy shifts of carbon and germanium photoelectron lines with prolonged etching time confirm the existence of an amorphous germanium carbide phase consisting of nonhomogeneous components in the interfacial region. This compound forms a buffer layer with a gradient of composition and microstructure from the substrate to the film and is beneficial to film adhesion.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
