Interfacial electronic state between hexagonal ZnO and cubic NiO.

Abstract

The interface of two dissimilar materials gives rise to a myriad of interesting structural, magnetic, and electronic properties that may be utilized to produce novel materials with unique characteristics and functions. In particular, growing a cubic oxide film on top of a hexagonal oxide substrate results in such unique properties due to the conflict of their respective stabilization mechanisms within the interface layer. This study aims to elucidate the electronic properties of the interface between hexagonal ZnO and cubic NiO by analyzing the interface electronic states within epitaxial NiO films grown on ZnO substrates, expressed in the form of ultraviolet photoemission spectroscopy (UPS) for valence band structure and X-ray absorption spectroscopy (XAS) spectra for conduction band structure. This is accomplished through a modeling approach in which the film, substrate, and interface signals are assumed to be related to each other by a set of mathematical equations, and then rearranging and modulating the equations to obtain unique UPS and XAS spectra that depict the interface electronic states.