Abstract
The current-voltage characteristics and deep traps of various GaAs/AlGaAs graded-index separate confinement heterostructure quantum well laser diode structures are studied as a function of the growth temperature and threshold current. It is shown that the interface nonradiative recombination processes cause a high threshold current. An impurity-related deep level with activation energy Ea=0.48 eV at the interface region and an interface state with wide energy distribution were found in the high threshold current diodes. The current-voltage characteristics show that interface recombination, rather than bulk recombination, is the dominant carrier transport process in the diodes and is responsible for the high threshold current.
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