Abstract
The surface and interface morphology and magnetization characteristics of Co 70Fe 30 thin films deposited on bare glass and p-Si/SiO 2 substrates and on conjugated polymer poly(3-hexylthiophene-2,5-diyl) (P3HT) thin films on such substrates have been studied by atomic force microscopy and magneto-optic Kerr effect. It was found that the average absolute magnitude of the coercive field of Co 70Fe 30 correlates with the roughness of the underlayer prior to Co 70Fe 30 deposition. P3HT deposited on p-Si/SiO 2 substrates possesses an increased surface roughness as compared to the p-Si/SiO 2 surface, but displays a decreased surface roughness as compared to the one of a bare glass substrate.
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