Abstract
The interface of epitaxial (Pb0.35Sr0.65)TiO3 films on MgO substrates grown by pulsed laser ablation was studied using transmission electron microscopy (TEM). Cross-section TEM studies revealed that the epitaxial films have a lattice mismatch of −6.2% with respect to the substrates. Electron diffraction pattern and high-resolution TEM image of the plan-view (Pb0.35Sr0.65)TiO3∕MgO interface present evidence of a modulated structure on the film plane. This allowed obtaining the actual lattice mismatch of −7.14% at the interface. Plan-view TEM of the interface is able to provide fundamental information that cannot be obtained by the cross-section TEM alone, and its advantages in studying such epitaxial films are addressed.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
