Abstract
ABSTRACTWe report the interface formation between silver (Ag) and pentacene, an organic material used as an active material in organic thin-film transistors, using x-ray and ultraviolet photoemission spectroscopy (XPS and UPS). XPS results indicate that silver does not chemically react with pentacene regardless of the deposition order. We see that neither pentacene nor silver exhibited simple layer by layer growth when deposited on the other. UPS results show that a dipole forms as pentacene is deposited on silver.
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