Abstract
Interface effect on the evolution of dislocation structure accompanying plastic deformation of layered LiF crystals under single-slip condition has been experimentally studied. The samples were prepared with X-ray irradiation of layers of LiF single crystals, interfaces between the irradiated (hard) and unirradiated (soft) regions being located along the specimen axis. It was found that plastic deformation under compression occurs by means of nucleation and development of slip bands in soft regions followed by their penetration into hard regions. When screw dislocations intersected the interface their density in the irradiated region increased sharply (up to by a factor of three). In edge slip bands, the dislocation etch pit densities were approximately the same in different regions. Influence of the irradiation time and of irradiated region size on the yield stress has been studied, too. The obtained results can be explained by a difference in parameters of double cross slip and multiplication of dislocations before and after intersecting the interface.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
