Abstract
Two types of beam-extraction intense light ion diodes are investigated. One is a single-stage applied-B ion diode installed on a simple coaxial pulsed power machine. Beam flux and beam divergence angle are measured simultaneously with spatial resolution using an arrayed ion pinhole camera (APC). Measured data show some relation between the distribution of beam divergence and beam flux. This result implies the importance of this type of diagnostics for studying the light ion diode. Experiments with another type of diode, a two-stage ion diode, are performed on an induction adder accelerator. In this diode, the output beam of the first stage is injected into the second-stage diode. The operation of the second diode is controlled by the injected beam. Shadow-box measurements on the two-stage diode indicate an improvement of beam divergence (half width full maximum) from 52+or-18 mrad to 27+or-6 mrad due to acceleration at the second diode. This improvement of beam divergence is in agreement with a calculated value using voltages of the first and the second stage diode. >
Published Version
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