Abstract

Colossal magnetoresistive (CMR) La 0.67Ca 0.33MnO 3 (LCMO) and La 0.67Sr 0.33MnO 3 (LSMO) films have been grown by pulsed laser deposition technique on GaAs(0 0 1) substrates buffered with epitaxial MgO layer. X-ray diffraction revealed strong c-axis out-of-plane orientation and strong in-plane texture of CMR/MgO bilayers on GaAs single crystal. The maximum temperature coefficient of resistivity TCR=9.0% K −1 at 223 K and 2.0% K −1 at 327 K, and the magnetoresistance Δ ρ/ ρ∼−7.95% kOe −1 and −1.47% kOe −1 have been achieved for LCMO/MgO/GaAs and LSMO/MgO/GaAs heteroepitaxial structures, respectively. Comparison with the test LCMO and LSMO films grown directly onto the bulk MgO(0 0 1) single crystal demonstrates the identity of LSMO/MgO/GaAs and LSMO/MgO films properties whereas the LCMO films grown on MgO buffered GaAs show lower transition temperature T c = 242 K compared to 253 K in LCMO/MgO.

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