Abstract
A scanning tunneling microscope has been incorporated in a usual scanning electron microscope. The specimen coarse positioner has three degrees of motion allowing one to choose any particular zone in a 2×2 mm specimen. The STM/SEM combined instrument is able to resolve graphite atoms and covers a wide range of magnification from 30 to 10 8.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
