Abstract

In this letter, we propose a charge trapping technique to enhance passivated emitter rear contact solar cell efficiency without changing the fabrication process. We trap the charge by applying voltage to the rear contact between the SiNx passivation layer and Si substrate with special metal screen printing. Furthermore, different charge voltages were applied for IV curve, fill factor, efficiency, and series resistance comparisons. The IV curve was measured with white light, with results showing that the fill factor and efficiency increase and series resistance decrease with an increase in charge voltage. Finally, a model was proposed to explain the charge trapping effect in the passivation layer.

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