Abstract
This work presents the integrated, multichannel readout circuit dedicated to FET-based THz detectors. Described solution provides an unique approach to FET detectors readout, able to replace the measurement equipment deploying the lock-in technique and to eliminate the necessity of modulating the THz wave. The IC proposed by the authors is based on the chopper amplifier architecture, enhanced and adapted for multichannel signal processing. It also ensures significant 1/f noise minimisation, which is the key requirement for the FET-based detectors readout. The circuit prototypes were manufactured in standard 350 nm CMOS process (AMS A.G.) and then measured in the dedicated test set-up.
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