Integral solution for diffraction problems involving conducting surfaces with complex geometries II Application to ellipsoidal surfaces

Abstract

The absorptivity and reflectivity are determined from the Fresnel coefficients of reflection and transmission by the complex ray-tracing method for a plane wave incident upon the surface Z(x, y) of an isotropic conducting medium located in vacuum. A coordinate-dependent real refractive index of the form ν(Z, σ, ω) = [q2(Z, σ, ω) + 2q(Z, σ, ω) cos θin + 1]1/2 is used, where q and cos θin are defined in part I of this series [ J. Opt. Soc. Am. A5, 200 ( 1988)]. Numerical results are presented for the scattered far fields, the surface waves, and the scattering and absorption efficiencies for ellipsoidal surfaces. We demonstrate the simplicity and accuracy of the complex ray-tracing method over the scalar-potentials method in solving for an absorbing medium located in parallel fields.