Abstract
Energy filtered (EF) imaging and energy loss fine structure analysis have now become routine tools to characterize very complex microstructures at high spatial resolution. When combined with energy dispersive x-ray spectroscopy microanalysis in a field emission gun transmission electron microscope (TEM) and with samples prepared by a large array of techniques such as FIB or microtoming, these analytical techniques can tackle real-life and more fundamental problems in materials science. This paper presents some examples of this work that highlight the complementarity of information obtained either from EF imaging, near-edge structures and EDS microanalysis. These examples are taken from work in the development of battery materials for automotive applications and in the study of ultrathin magnetic layers. Other examples of high spatial resolution energy loss fine structure at interfaces of high-K dielectric-Si in interface are shown in elsewhere in these proceedings.
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