Abstract
CoCr thin-film magnetic media used in HDD (hard disk drive) usually show in-plane magnetic anisotropy. We have studied in-plane crystallographic structure of CoCr magnetic films on circumferentially textured and non-textured substrates by grazing incidence X-ray diffraction (GIXD) using synchrotron radiation. Textured substrate induces in-plane c-axis preferential alignment of hep-Co alloy crystallites to circumferential texture direction under the effect of texture roughness and sputtering deposition condition. Non-textured substrate produce in-plane isotropic structure. Sputtering process induce compressive strain in CoCr magnetic films on both textured and non-textured substrates. High energy ions in sputtering process are supposed to induce compressive strain through increasing non-strained interplanar spacings of hep-Co alloy crystallites.
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