Abstract
We report on the physical operation and performance of MOCVD-grown abrupt heterojunction InP/GaAs/sub 0.51/Sb/sub 0.49//InP double heterojunction bipolar transistors (DHBTs). In particular, the effect of the InP collector thickness on the breakdown voltage and on the current gain cutoff frequency is assessed and a f/sub T/ of 106 GHz is reported for a DHBT with a 400 /spl Aring/ base and a 2000 /spl Aring/ InP collector with a BV/sub CEO/ of 8 V. We show that InP/GaAsSb/InP DHBTs are characterized by a weak variation of f/sub T/ as a function of temperature. Finally, we also demonstrate that high maximum oscillation frequencies f/sub MAX/>f/sub T/ can be achieved in scaled high-speed InP/GaAsSb/InP DHBTs, and provide estimates of the maximum cutoff frequencies achievable for this emergent but promising material system. Recent results on improved structures validate our performance predictions with cutoff frequencies well beyond 200 GHz.
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