Abstract

Interposers with through-silicon vias (TSVs) play a key role in the three-dimensional integration and packaging of integrated circuits and microelectromechanical systems. In the current practice of fabricating interposers, solder balls are placed next to the vias; however, this approach requires a large foot print for the input/output (I/O) connections. Therefore, in this study, we investigate the possibility of placing the solder balls directly on top of the vias, thereby enabling a smaller pitch between the solder balls and an increased density of the I/O connections. To reach this goal, inkjet printing (that is, piezo and super inkjet) was used to successfully fill and planarize hollow metal TSVs with a dielectric polymer. The under bump metallization (UBM) pads were also successfully printed with inkjet technology on top of the polymer-filled vias, using either Ag or Au inks. The reliability of the TSV interposers was investigated by a temperature cycling stress test (−40 °C to +125 °C). The stress test showed no impact on DC resistance of the TSVs; however, shrinkage and delamination of the polymer was observed, along with some micro-cracks in the UBM pads. For proof of concept, SnAgCu-based solder balls were jetted on the UBM pads.

Highlights

  • One of the major technology drivers in microelectromechanical systems (MEMS) is to incorporate increasing numbers of functionalities within the same foot print

  • Inkjet printing and super inkjet (SIJ) technology were demonstrated to be available for use in performing the process of dielectric filling of hollow through-silicon vias (TSVs) with an UV-curable hybrid polymer that has a low Young’s modulus

  • After baking, SIJ-filled vias suffered from partial detachment of the polymer from the via walls, which could be attributed to weak adhesion

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Summary

Introduction

One of the major technology drivers in microelectromechanical systems (MEMS) is to incorporate increasing numbers of functionalities within the same foot print. The interposer provides a possibility to integrate dies that are manufactured with different technologies, such as memory, power, logic, MEMS, and radio frequency (RF)

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