Abstract
Initial oxidation of the Ce–Ru(0001) overlayer system has been studied by photoelectron spectroscopy and low energy electron diffraction. The Ce overlayer thicknesses ranged from 2 to 7 Å. The interface was studied at annealing temperatures up to 1000°C and it was oxidized at low oxygen exposures up to 68 l at 500°C. Interactions between Ce and Ru at the interface were indicated by intensity variations of the Ce3d4f2 and Ce3d4f0 features with annealing temperature. No intermixing between Ce and Ru exceeding one monolayer was observed. Upon oxidation, trivalent Ce2O3 oxide was initially observed at the surface. With increased oxygen exposures, a conversion from trivalent oxide to ‘tetravalent’ CeO2 was seen. The Ce overlayer had no catalytic effect on oxidation of the Ru substrate in contrast to previous studies on other refractory metal, such as Nb, Ta or W.
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