Abstract
In this paper the principal and more important application of Infrared Thermography are discussed. In particular the application of this experimental technique, both in its transient and steady-state mode of operation, are reported and illustrated through a broad set of experiments and examples. Functional application to the characterization of VLSI devices, application to the failure analysis of large area power devices, current monitoring in state-of-art heterojunction and organic devices prove the high potential of this technique.
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