Abstract
The feasibility of observing the zone-center longitudinal optical phonon (LO) of a crystal as a minimum in its infrared transmission spectrum, when measured with radiation obliquely incident on a thin film of the crystal, i.e., the Berreman effect, is demonstrated with an MBE′-grown zinc-blende MnTe epilayer. Whereas the zone-center transverse optic phonon (TO) appears irrespective of the polarization of the incident radiation for both normal and oblique incidence, the LO can be detected only in the latter with light polarized in the plane of incidence. We have verified the Berreman effect in a variety of MBE-grown II–VI epilayers and heterostructures.
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