Abstract
We demonstrate the coupling of a scattering near-field scanning optical microscope combined with a Fourier transform infrared spectrometer. The set-up operates using either the near-field thermal emission from the sample itself, which is proportional to the electromagnetic local density of states, or with an external infrared synchrotron source, which is broadband and highly brilliant. We perform imaging and spectroscopy measurements with sub-wavelength spatial resolution in the mid-infrared range on surfaces made of silicon carbide and gold and demonstrate the capabilities of the two configurations for super-resolved near-field mid-infrared hyperspectral imaging and that the simple use of a properly chosen bandpass filter on the detector allows one to image the spatial distribution of materials with sub-wavelength resolution by studying the contrast in the near-field images.
Published Version
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