Abstract
The electrical properties of ferroelectric thin films are sensitive to structural disorders. However, the harmful structural defects are often difficult to be characterized by conventional characterization techniques. Here, we demonstrate that the local structures of lead zirconate titanate (PZT) ferroelectric thin films with different amorphous phase contents can be determined using x-ray absorption fine structure (XAFS) spectroscopy of synchrotron radiation. The results showed that XAFS spectroscopy is a powerful technique to quantify the amorphous phase content in ferroelectric thin films. Influences of the amorphous phase on local structures and properties of ferroelectric thin films were further discussed.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
