Abstract
Thin films prepared by co-sputtering present slight inhomogeneities in composition and thickness. In this work we analyze the effect of this lack of uniformity on local magnetization processes in amorphous thin films (Fe x Si 1 − x ) having perpendicular anisotropy. Local magnetization processes have been studied by transverse Kerr effect. Variations in the coercive field H c-suggest that the reversal of magnetization occurs locally.
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