Abstract
The main reasons for the occurrence of temperature error and perspective directions of decreasing of its value are presented by improving the device design based on the phenomenon of surface plasmon resonance (SPR) and numerical methods of processing the results of measurements by this device. The most essential influence on changes in results of measurements can be rendered by temperature changes in the analyte refractive index. It is shown that the application of the integrated temperature stabilization of the device with the test substance, and numerical processing of the measurement results for compensation of temperature changes of the test substance and the use of film heaters it is possible to reduce the measurement error of the refractive index of the analyte at least 30 times from 2.4 × 10-4 to 7.6 × 10-6.
Highlights
One of the promising directions in developing analytical devices is application of surface electromagnetic waves from the optical range in 1D - 3D nanostructures as well as observation of surface plasmon resonance phenomena arising in this case
Compensation was provided by taking into account the temperature coefficient of the analyte refraction index that is equal to ТКn (Н2O) = -1.15 × 10−4 К−1 as well as temperature changes of water during measurements, which were determined by using the thermo resistor built-in into the case of flow-through measuring cell in the surface plasmon resonance (SPR) device
Analytical instruments based on SPR phenomena are highly sensitive to low concentrations of studied substances, which allow their usage in laboratory research conducted in the food, chemical and pharmaceutical industry, agriculture, medicine and ecology
Summary
One of the promising directions in developing analytical devices is application of surface electromagnetic waves from the optical range in 1D - 3D nanostructures as well as observation of surface plasmon resonance phenomena arising in this case. The wavelength of excitation of the surface plasmons, the topology of the sensitive element of the device and the temperature change elements of the optical scheme of the instrument and analyte are the main factors. The impact of temperature is one of important factors of influence It determines the half of the size error of the measurement result. The authors present the basic causes of temperature error It is shown a promising direction of reducing its size by improving the design of SPR-device and numerical methods for processing results of measurements by this device
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