Abstract
ZnSe thin films were deposited onto glass substrates by vacuum thermal evaporation technique. The substrate temperature was varied from 300 K to 473 K. The films structure was studied by means of X-ray diffraction technique (XRD). The film crystallites present a preferential orientation with the (111) planes parallel to the substrate surface. The surface morphology was investigated by vertical scanning interferometry (VSI). The surface roughness parameters of thin films were calculated. The optical properties of ZnSe thin films were investigated using spectrophotometric measurements of transmittance and reflectance in the 275-1100 nm wavelength range.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Annals of the ”Dunarea de Jos” University of Galati. Fascicle II, Mathematics, Physics, Theoretical Mechanics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
