Abstract
Variations in exchange coupling for NiFe/Cu/IrMn trilayer thin films were examined as a function of the Cu spacer thickness. The exchange coupling field and an uniaxial anisotropy field were analyzed by ferromagnetic resonance measurements with an angular variation. Angular dependence of resonance field showed unidirectional behavior but the film with thick Cu layer showed a similar trend to uncoupled NiFe single layer film. As Cu spacer thickness increase, the exchange coupling field and the uniaxial anisotropy field decreased with different decrease trend from Cu spacer thickness of 0.8 nm.
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