Abstract

The influence of rare earth (RE = Dy, Gd, Yb) ion doping on the structural, magnetic and optical properties of cobalt ferrite thin films was studied. CoFe2-xRExO4 (x = 0.01; 0.03; 0.05; 0.1; 0.2; 0.3) films were obtained by pulsed laser deposition on silicon substrates. The X-ray diffraction and Raman spectroscopy results on the bulk materials, which were used as targets during deposition, revealed the formation of residual phases as the concentration of RE dopant was increased. However, the annealed thin films presented diffraction lines and vibrational modes corresponding only to cobalt ferrite. A lower crystallinity of the deposited samples was observed when higher RE concentrations were used. Due to the substitution of Fe by RE elements which possess large ionic radii, the lattice parameter of the thin films presented a monotonous increase. The magnetic response of the nanostructures was correlated to the magnetic moment of the RE dopant and to the structural properties of the films. The optical bandgaps derived from the reflectance spectra presented an increasing trend as the Yb and Dy concentrations were augmented.

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