Abstract
In this paper, we study the influence of oxygen pressure on structural, optical and magnetic properties of pure ZnO films. The chemical compositions and thickness of the film were estimated by Rutherford backscattering spectrometry measurements. X-ray diffraction patterns show all the films are in single phase and preferred along (002) orientation. With an increase of oxygen pressure, grain growth and average root mean square roughness is found to be increased. It is found that the intensity of UV emission peak increases whereas visible emission peak decreases in intensity with an increase of oxygen pressure. From the magnetization measurements, it is observed that ZnO film grown without oxygen pressure shows an enhanced ferromagnetic behaviour than that of the films grown with oxygen pressure of 0.05 and 0.1 mbar.
Published Version
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