Abstract
Ni-doped PbS thin film was deposited on a glass substrate using successive ionic layer adsorption and reaction method. The grown thin film has been characterized by X ray Diffraction (XRD), SEM/EDAX, UV–vis spectroscopy and vibrating sample magnetometer. The X-ray diffraction pattern of the film shows the formation of PbS having a face centered cubic structure with the preferential orientation along (111). UV–vis spectroscopy results showed the direct band gap of Ni-doped PbS thin film with band gap 2.67eV. The VSM studies reveal that the grown thin film behaves as a soft magnetic material.
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