Abstract
Earth-abundant Cu2ZnSnS4 is a promising alternative photovoltaic material which has been examined as absorber layer of thin film solar cells. In this study, Cu2ZnSnS4 (CZTS) thin films have been successfully fabricated by sulfurizing stacked precursor thin films via successive ionic layer adsorption and reaction (SILAR) method. The prepared CZTS thin films have been characterized by X-ray diffraction, energy dispersive spectrometer, Raman spectroscopy, UV–vis spectroscopy, Hall effect measurements and photoelectrochemical tests. Results reveal that the thin films have kesterite structured Cu2ZnSnS4 and the p-type conductivity with a carrier concentration in the order of 1018cm−3 and an optical band gap of 1.5eV, which are suitable for applications in thin film solar cells.
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