Abstract
We report noise-induced threshold shifts on various electrohydrodynamic instabilities (EHIs) in a nematic liquid crystal. There exist three characteristic frequencies ( f 1 , f 2 , and f 3 ) in the ac-driven EHI system. By controlling the cutoff frequency f c of external multiplicative noise, we examine the dependence of the thresholds on the noise intensity V N for the Williams domain ( f 1 f 3 ), and prewavy ( f > f 2 ). Moreover, a dc-driven EHI (isotropic mode) is dealt with in the same way. Depending on V N and f c , noise plays an important role in stabilizing or destabilizing EHIs. The influence of noise on the instability mechanisms and their specific structures is discussed on the basis of the present experimental results.
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