Abstract
The influence of carrier-free surface layers on infrared reflection spectra of metallic oxides has been explored using model calculations on two-layer systems. Reflectivity minima are found at LO phonon frequencies. Comparison is made with preliminary experimental data from Sb-doped SnO 2 ceramics and Na 0.6WO 3 single crystal surfaces oxidised in air at 500°C.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Electron Spectroscopy and Related Phenomena
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
