Abstract
Thermal evaporation technique was used to prepare the Platinum octaethylporphyrin (PtOEP) thin films at room temperature. The deposited films were studied before and after thermal annealing at 373 and 473K for 3h under vacuum (10−3Pa). The film structure, surface morphologies and molecular structure were investigated as a function of annealing temperature by X-ray Diffraction (XRD), Field-Emission Scanning Electron Microscopy (FESEM) and Fourier-transform infrared techniques (FT-IR) respectively. The results confirmed that the as-deposited and annealed films have nanostructural features. Optical constants of the as-deposited and annealed films have been obtained in the wavelength range 200–1100nm by using spectrophotometric measurements. Analysis of the spectra of absorption coefficient showed indirect allowed transition and optical energy gap found to decrease with increase in annealing temperature. The dispersion of refractive index at the normal dispersion (λ>600nm) was discussed in terms of single oscillator model of Wemple–Didomenico. Based on generalized Miller’s rule the third order non-linear susceptibility, χ(3) and nonlinear refractive index, n2 were estimated and studied at lower photon energy and showing lower value for the annealed film.
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