Abstract
Thin films of titanyl phthalocyanine (TiOPc) have been deposited on both fused quartz and glass substrates by the thermal evaporation technique. The structural and optical properties of the as-deposited and annealed films have been reported. The structural features of the as-deposited and annealed films have been studied by X-ray diffraction (XRD), field-emission scanning electron microscopy (FESEM), and Fourier-transform infrared (FT-IR) technique. The optical constants (refractive index, n, and absorption index, k) of the films have been presented for the first time in the wavelength range 200–2500nm by using spectrophotometric measurements at nearly normal incidence. The band gaps of the as-deposited film at 1.48eV and 2.5eV corresponding to Q-band and B or Soret band were red-shifted to 1.15eV and 2.19eV, respectively, when the film annealed at 433K.
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