Abstract
The noise level in a pyroelectric device and therefore the sensitivity is dictated mainly by the dielectric losses in pyroelectric materials. An annealing procedure has been developed that reduces the dielectric loss significantly. The procedure consists of subjecting the ferroelectric liquid crystal sample to an electric field in the isotropic phase and cooling it into the smectic phase at a certain rate. After measurement of the dielectric parameters, the sample is reheated into the isotropic phase and then cooled again at a slower rate into the smectic phase. The entire process is repeated for successively slower cooling rates. We present the results of this annealing treatment and explain the origin of this phenomenon.
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