Abstract
This work investigates the influence of alternate biasing on TID effects in mixed-signal programmable devices. By reducing the time the device is biased when exposed to ionizing radiation, the severity of TID effects is also reduced, due to the increasing in the initial recombination of electron-hole pairs and the radiation induced charge neutralization effect. These effects are investigated considering a switched capacitor filter prototyped in a Field Programmable Analog Array. Eight samples of such device were exposed to gamma radiation while the devices were alternately biased, by repeatedly turning the power on and off, corresponding to different equivalent total biasing times and duty-cycles. Results show increase in radiation tolerance to the alternate biased devices, which is dependent also on the biasing duty-cycle. Considering this behavior, a novel system level radiation hardening technique, based on modular redundancy, associated to an alternate biasing scheme, is also proposed in this paper.
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